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e-book

Optical Diagnostics for Thin Film Processing (Cód: 3027673)

Herman,Irving P.

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Optical Diagnostics for Thin Film Processing

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Descrição

This volume describes the increasing role of in situ optical diagnostics in thin film processing for applications ranging from fundamental science studies to process development to control during manufacturing. The key advantage of optical diagnostics in these applications is that they are usually noninvasive and nonintrusive. Optical probes of the surface, film, wafer, and gas above the wafer are described for many processes, including plasma etching, MBE, MOCVD, and rapid thermal processing. For each optical technique, the underlying principles are presented, modes of experimental implementation are described, and applications of the diagnostic in thin film processing are analyzed, with examples drawn from microelectronics and optoelectronics. Special attention is paid to real-time probing of the surface, to the noninvasive measurement of temperature, and to the use of optical probes for process control. Optical Diagnostics for Thin Film Processing is unique. No other volume explores the real-time application of optical techniques in all modes of thin film processing. The text can be used by students and those new to the topic as an introduction and review of the subject. It also serves as a comprehensive resource for engineers, technicians, researchers, and scientists already working in the field.The only volume that comprehensively explores in situ, real-time, optical probes for all types of thin film processingUseful as an introduction to the subject or as a resource handbookCovers a wide range of thin film processes including plasma etching, MBE, MOCVD, and rapid thermal processingExamples emphasize applications in microelectronics and optoelectronicsIntroductory chapter serves as a guide to all optical diagnostics and their applicationsEach chapter presents the underlying principles, experimental implementation, and applications for a specific optical diagnostic

Características

Peso 0.00 Kg
Produto sob encomenda Não
Marca ELSEVIER S&T
Idioma 337
Acabamento e-book
Territorialidade Internacional
Formato Livro Digital Pdf
Gratuito Não
Proteção Drm Sim
Tamanho do Arquivo 37595
Início da Venda 23/10/1996
Código do Formato Pdf
Cód. Barras 9780080538082
Ano da edição 101995
Ano da Publicação 1996
AutorHerman,Irving P.