Artboard 33Artboard 16Artboard 18Artboard 13Artboard 42Artboard 21Artboard 4Artboard 5Artboard 45Artboard 22Artboard 7Artboard 42Artboard 23Artboard 12Artboard 28Artboard 17?Artboard 28Artboard 43Artboard 49Artboard 47Artboard 15Artboard 32Artboard 6Artboard 22Artboard 5Artboard 25Artboard 1Artboard 42Artboard 11Artboard 41Artboard 11Artboard 23Artboard 10Artboard 4Artboard 9Artboard 6Artboard 8Artboard 7Artboard 3Artboard 12Artboard 25Artboard 34Artboard 43Artboard 44Artboard 16Artboard 24Artboard 13Artboard 5Artboard 24Artboard 31Artboard 1Artboard 12Artboard 27Artboard 30Artboard 36Artboard 44Artboard 9Artboard 17Artboard 6Artboard 27Artboard 30Artboard 29Artboard 26Artboard 2Artboard 20Artboard 35Artboard 15Artboard 14Artboard 50Artboard 26Artboard 14Artboard 40Artboard 21Artboard 10Artboard 37Artboard 46Artboard 33Artboard 8

Secondary Ion Mass Spectrometry - An Introduction To Principles And Practices (Cód: 9396518)

Van Der Heide,Paul

John Wiley & Sons

Ooops! Este produto não está mais a venda.
Mas não se preocupe, temos uma versão atualizada para você.

Ooopss! Este produto está fora de linha, mas temos outras opções para você.
Veja nossas sugestões abaixo!

R$ 749,90

em até 10x de R$ 74,99 sem juros
Cartão Saraiva: 1x de R$ 712,41 (-5%)

Total:

Em até 1x sem juros de


Crédito:
Boleto:
Cartão Saraiva:

Total:

Em até 10x sem juros de


Secondary Ion Mass Spectrometry - An Introduction To Principles And Practices

R$749,90

Quer comprar em uma loja física? Veja a disponibilidade deste produto

Entregas internacionais: Consulte prazos e valores de entrega para regiões fora do Brasil na página do Carrinho.

ou receba na loja com frete grátis

X
Formas de envio Custo Entrega estimada

* Válido para compras efetuadas em dias úteis até às 15:00, horário de Brasília, com cartão de crédito e aprovadas na primeira tentativa.

X Consulte as lojas participantes

Saraiva MegaStore Shopping Eldorado Av. Rebouças, 3970 - 1º piso - Pinheiros CEP: 05402-600 - São Paulo - SP

Descrição

Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) - Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations - Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission - Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) - Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions - Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other Secondary Ion Mass Spectrometry (SIMS) has become an indispensible, fully commercialized micro-analytical technique applied in a diverse range of fields spanning the Materials Sciences, Earth sciences and Bio-Sciences with new application field continually being uncovered. This book provides a pedagogic function as well as a research tool to anyone involved in any of these forms of SIMS (senior undergraduates through seasoned professionals within academia or industry). This book does so by supplying a clear and definitive introduction to: a) The fundaments of sputtering and secondary ion formation/survival inclusive of pertinent models for elemental and molecular emission b) Both the theory and application, inclusive of modes of operation, of the latest instrumentation used in Static SIMS, Dynamic SIMS or Cluster SIMS c) Data collection and processing protocols along with reasons for any distortions that can be introduced Amalgamation of theory with experimental data from a practitioner's perspective is the core feature of this book. This is aided through the use of numerous illustrations from highly diverse fields are included. All sections are prepared such that each can be read independently of each other. Commonly used reference tables, review questions, vendors and contacts and descriptions of related techniques presented in the Appendix.

Características

Peso 0.66 Kg
Produto sob encomenda Sim
Marca John Wiley & Sons
I.S.B.N. 9781118480489
Referência 028300624
Altura 23.62 cm
Largura 15.75 cm
Profundidade 2.29 cm
Idioma Inglês
Acabamento Capa dura
Cód. Barras 9781118480489
Ano da edição 2014
AutorVan Der Heide,Paul